Imaging and quantification of nano-layers in water with the SEEC technique

The SEEC technique (surface enhanced ellipsometric technique) permits to image objects of nanometric thickness with a conventional microscope. We present here recent developments of the SEEC technique for applications in an immersed environment. New reflecting and transparent SEEC substrates have been fabricated, a calibration protocol has been developped to allow absolute thickness measurements, and the coupling of the SEEC technique with microfluidics devices has been achieved, which opens the possibility to perform high-throughput measurements. We present results with silane monolayers, vesicles interacting with surfaces, living cells, nanoparticle suspensions and polyelectrolytes

– Work supported by Rhodia and Nanolane companies.

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